Probers

Manual Analytical Submicron Prober is designed to make electrical contact between measuring circuits and IC patterns, micron/submicron metallized buses, for visual inspection of structures as well as for isolation of some patterns during diagnostics of internal IC block condition under normal and higher temperatures

EM-6190A automatic prober is designed to ensure electrical contact between probes and contact pads of ICs on the wafer

The semiautomatic EM-6520 prober is intended for finishing and interoperational control of LSI and VLSI on a wafer having a diameter of up to 200 mm

The semiautomatic EM-6520-1 prober is intended for finishing and interoperational control of LSI and VLSI on a wafer having a diameter of up to 200 mm

EM-6290 new generation Automatic Prober is intended to provide for contacting between probes and IC contact pads