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EM-5001B

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Laser Mask Repair System EM-5001B


EM-5001B system is intended for repairing masks (reticles) having transparent and opaque defects: pindots, protrusions, shorts between features, missing features, corner rounding, pinholes, mouse bites, breaks, size shifts, etc. The system repairs defects on chrome, chrome-oxide, iron-oxide coated reticles having the following SEMI standard sizes:

  • 4”x4” (102x102 mm)
  • 5”x5” (127x127 mm)
  • 6”x6” (153x153 mm)
  • 7”x7” (178x178 mm)

For repair of opaque defects, a contour path-projection method of optical imaging is used: the image is sythesized as a result of the laser beam step-by-step tracing around a contour path, the laser beam cross-section being a microprojection of a simple figure, for example a square.

Advantages of the method:

  • high pattern accuracy is determined by a minimal-edge-roughness capability and ensured by a rectangular shape of the image forming feature as well as by the image forming feature as well as by the uniform energy distribution in it;
  • high resolution;
  • minor energy loss in a reticle.

To repair opaque defects the system uses Lotis LS-2122M laser with wave length of 532 nm. Transparent defects are repaired through the laser stimulated deposition of metal-organic compounds. As a radiation source, the argon 185F02 Spectra Physics laser is used.

Specifications

Working field size 153 x 153 mm
Size defects repaired:
transparent Ø2 to 25 µm
opaque 1 x 1 µm to 25x25 µm
Angular position of a feature (area under repair) 0 to 45°
Accuracy of lase beam pointing at a defect 0.5 µm
Opaque defect programmable size resolution with reference to X-Y 0.1 µm
Overall dimensions (mm):
machine unit 520x1320x1230 mm
control unit 300x710x1745 mm
laser power supply rack 553x693x1059 mm
Weight 1660 kg

Russian version
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