Microscopes

Microscopes are designed for visual inspection of semiconductor wafers and photomasks as well as for researches in other fields of science and technology

The inverted microscopes MI-1 and MI-1T are intended for inspection and research in metallography and other fields of science and technology

MI-2 and MI-2T inverted microscopes are intended for a wide scope of tasks in various fields of science, technology, and education.

The microinspection station is an inspection and measuring system based on the MICRO 200-01 (MICRO 200T-01)microscope

The microinspection station is an inspection and measurement system based on the MI-1 microscope

The MK-AM system is intended for visual die inspection of IC, using a microscope, with the aim of finding bad dice on the wafers and marking them automatically